Radiation tolerant electronics for the LHC experiments

The harsh radiation environment at the LHC poses formidable challenges to the design, fabrication and test procedures that must be applied in the development of ASICs embedded in the detectors. The use of Commercial-Off-The-Shelf (COTS) components in the LHC environment also requires a careful evaluation of the impact of radiation-induced effects on their performance and reliability. This review paper discusses the issues of Total Dose effects (TID), displacement damage and Single Event Effects (SEE) expected in the LHC environment, and discusses the relevance for LHC experiments of the experience gained by the Space community in this field.